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DescriptionQ182
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Q182DesignAMDASIC interview problem

Contain unknowns before scan compaction

TechniquesDesignDFTTestContaincompaction
DifficultyMedium
TopicDFT & Physical Design
LanguageSystemVerilog
Format4 choices
01

Problem

During a scan-capture test, one known nondeterministic source can drive X into a response bit before many scan chains feed a compacting signature register. Which DFT measure directly prevents that source from contaminating the compacted signature while preserving other known response bits?

02

Answer choices (4)