Preparing questions and your practice workspace.
ASIC implementation interview preparation
Practice the implementation questions first, then refresh the scan, floorplan, timing, power, and closure reasoning behind strong backend interview answers.
Part 1 · DFT and memory test
Treat RTL-to-GDS as a chain of explicit contracts. Each stage consumes design intent, changes the implementation, and produces evidence for the next owner.
Part 1 · DFT and memory test
Scan converts difficult sequential state into controllable and observable test state. ATPG still needs a sensitized path and a capture event that preserves the fault effect.
Part 1 · DFT and memory test
Memory BIST, scan compression, and JTAG solve different access problems. Their controllers, clocks, resets, and result paths must compose without contention.
Part 2 · Physical implementation
A useful floorplan reserves routing, power, and clock resources before placement optimizes local timing. Macro geometry and pin access often dominate the first-order result.
Part 2 · Physical implementation
Post-route behavior depends on distributed resistance, capacitance, coupling, and the voltage delivered by the power grid. A timing-only wire fix can move congestion or power risk elsewhere.
Part 3 · Timing and signoff
Static timing compares data arrival against a required sampling window for every declared scenario. Clocks, exceptions, uncertainty, and variation define that window.
Part 3 · Timing and signoff
Tapeout readiness is an intersection, not a best result. Timing, signal integrity, power integrity, physical verification, and logical equivalence must all pass their required scope.