Controllability · observability · test quality
DFT Engineer Interview Questions
Connect scan architecture, ATPG fault models, memory test, JTAG access, response compaction, X containment, at-speed timing, diagnosis, and implementation signoff.
18questions5technical areas2linked guides
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- Q1010ASIC FlowOrder the digital ASIC implementation flowDesign · Physical DesignEasyP
- Q864DFTScan shift versus captureDFT · ScanEasyP
- Q447DFTGenerate a scan shift-capture sequenceDFT · ScanMediumP
- Q163DFTEight-bit scan-chain RTLDFT · ScanMedium
- Q091DFT and Physical DesignSummarize one 32-bit scan-unload mismatchDesign · DFTEasy
- Q246DFT and Physical DesignFour-bit JTAG instruction registerDesign · DFTMedium
- Q382DFTArchitect scan, MBIST, and JTAG accessDesign · DFTHardP
- Q392DFT and Physical DesignContain unknowns before scan compactionDesign · DFTMediumP
- Q502DFT and Physical DesignModel a four-bit MISR signatureDesign · DFTMediumP
- Q670DFT and Physical DesignDetect a transition-delay fault at speedDesign · DFTMediumP
- Q499DFT and Physical DesignFind each scan chain's first failing patternDesign · DFTHardP
- Q556DFT and Physical DesignDrive a complete March C-minus memory testDesign · DFTHardP
- Q317Physical Design and DFTChoose a pattern for an adjacent-row disturb faultDesign · DFTEasyP
- Q936Physical Design and DFTChoose the operation that exposes a stuck-at-zero SRAM cellDesign · DFTEasyP
- Q993Formal VerificationFind vectors that expose internal stuck-at faultsDV · DesignMediumP
- Q1048Formal VerificationTest 128 lines for stuck faults and pairwise shortsDV · DesignHardP
- Q1006Physical Design and DFTScan-shift testbench modelDesign · DFTMediumP
- Q1062Physical Design and DFTCount unique detected faultsDesign · DFTMediumP
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- Hard4
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