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Controllability · observability · test quality

DFT Engineer Interview Questions

Connect scan architecture, ATPG fault models, memory test, JTAG access, response compaction, X containment, at-speed timing, diagnosis, and implementation signoff.

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Showing 18 of 18All questions visible
  1. Q1010ASIC FlowOrder the digital ASIC implementation flowDesign · Physical DesignEasyP
  2. Q864DFTScan shift versus captureDFT · ScanEasyP
  3. Q447DFTGenerate a scan shift-capture sequenceDFT · ScanMediumP
  4. Q163DFTEight-bit scan-chain RTLDFT · ScanMedium
  5. Q091DFT and Physical DesignSummarize one 32-bit scan-unload mismatchDesign · DFTEasy
  6. Q246DFT and Physical DesignFour-bit JTAG instruction registerDesign · DFTMedium
  7. Q382DFTArchitect scan, MBIST, and JTAG accessDesign · DFTHardP
  8. Q392DFT and Physical DesignContain unknowns before scan compactionDesign · DFTMediumP
  9. Q502DFT and Physical DesignModel a four-bit MISR signatureDesign · DFTMediumP
  10. Q670DFT and Physical DesignDetect a transition-delay fault at speedDesign · DFTMediumP
  11. Q499DFT and Physical DesignFind each scan chain's first failing patternDesign · DFTHardP
  12. Q556DFT and Physical DesignDrive a complete March C-minus memory testDesign · DFTHardP
  13. Q317Physical Design and DFTChoose a pattern for an adjacent-row disturb faultDesign · DFTEasyP
  14. Q936Physical Design and DFTChoose the operation that exposes a stuck-at-zero SRAM cellDesign · DFTEasyP
  15. Q993Formal VerificationFind vectors that expose internal stuck-at faultsDV · DesignMediumP
  16. Q1048Formal VerificationTest 128 lines for stuck faults and pairwise shortsDV · DesignHardP
  17. Q1006Physical Design and DFTScan-shift testbench modelDesign · DFTMediumP
  18. Q1062Physical Design and DFTCount unique detected faultsDesign · DFTMediumP

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  • Hard4
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